Testability Concepts for Digital ICs: The Macro Test Approach

Testability Concepts for Digital ICs: The Macro Test Approach

Paperback(1995)

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Product Details

ISBN-13: 9781461360049
Publisher: Springer US
Publication date: 10/04/2012
Series: Frontiers in Electronic Testing , #3
Edition description: 1995
Pages: 212
Product dimensions: 6.10(w) x 9.25(h) x 0.02(d)

Table of Contents

Preface. 1. Introduction. 2. Defect-Oriented Testing. 3. Macro Test: A Framework for Testable IC Design. 4. Examples of Leaf-Macro Test Techniques. 5. Scan Chain Routing with Minimal Test Application Time. 6. Test Control Block Concepts. 7. Exploiting Parallelism in Leaf-Macro Access. 8. Timing Aspects of CMOS VLSI Circuits. List of Symbols and Abbreviations. References. Index.

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