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Testing for Small-Delay Defects in Nanoscale CMOS Integrated Circuits

By Sandeep K. Goel (Editor), Krishnendu Chakrabarty (Editor)
eBook
$83.95
By Sandeep K. Goel (Editor), Krishnendu Chakrabarty (Editor)
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Advances in design methods and process technologies have resulted in a continuous increase in the complexity of integrated circuits (ICs). However, the increased complexity and nanometer-size features of modern ICs make them susceptible to manufacturing defects, as well as performance and quality issues. Testing for Small-Delay Defects in Nanoscale CMOS Integrated Circuits covers common problems in areas such as process variations, power supply noise, crosstalk, resistive opens/bridges, and...

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Science & TechnologyEngineeringTechnologyElectrical & Electronic EngineeringTechnology - General & MiscellaneousElectronics - Circuits - GeneralNanotechnologyElectronics - Circuits * General