Thin Film and Depth Profile Analysis

The characterization of thin films and solid interfaces as well as the determination of concentration profiles in thin solid layers is one of the fields which re­ quire a rapid transfer of the results from basic research to technological applications and developments. It is the merit of the Dr. Wilhelm Heinrich and Else Heraeus-Stiftung to promote such a transfer by organizing high standard seminars mostly held at the "Physikzentrum" in Bad Honnef near Bonn. The present book has been stimul...