VLSI Design and Test: 22nd International Symposium, VDAT 2018, Madurai, India, June 28-30, 2018, Revised Selected Papers
eBook
$99.00
By S. Rajaram (Editor), N.B. Balamurugan (Editor), D. Gracia Nirmala Rani (Editor), Virendra Singh (Editor)
Collect stamps to save with Rewards. 10 stamps = $5. Learn More
Select a store to view item availability.
Available on compatible , the free NOOK App, and in My Digital Library
NOOK App
Download NOOK app
NOOK Devices
NOOK eReaders
- NOOK GlowLight 4 Plus
- NOOK GlowLight 4e
- NOOK GlowLight 4
- NOOK GlowLight Plus 7.8"
- NOOK GlowLight 3
- NOOK GlowLight Plus 6"
NOOK Tablets
- NOOK 9" Lenovo Tablet
- NOOK 10" HD Lenovo Tablet
- NOOK Tablet 7" & 10.1"
- NOOK by Samsung Galaxy Tab 7.0 [Tab A and Tab 4]
- NOOK by Samsung [Tab 4 10.1, S2 & E]
Free NOOK Reading Apps
- NOOK for iOS
- NOOK for Android
BN.com website
Go to your Digital Library in My Account
Limit 1 per customer
This book constitutes the refereed proceedings of the 22st International Symposium on VLSI Design and Test, VDAT 2018, held in Madurai, India, in June 2018.
The 39 full papers and 11 short papers presented together with 8 poster papers were carefully reviewed and selected from 231 submissions. The papers are organized in topical sections named: digital design; analog and mixed signal design; hardware security; micro bio-fluidics; VLSI testing; analog circuits and devices; network-on-chip; me...
The 39 full papers and 11 short papers presented together with 8 poster papers were carefully reviewed and selected from 231 submissions. The papers are organized in topical sections named: digital design; analog and mixed signal design; hardware security; micro bio-fluidics; VLSI testing; analog circuits and devices; network-on-chip; me...























