Data-Driven Fault Detection for Industrial Processes: Canonical Correlation Analysis and Projection Based Methods

Data-Driven Fault Detection for Industrial Processes: Canonical Correlation Analysis and Projection Based Methods

by Zhiwen Chen

Paperback(1st ed. 2017)

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Product Details

ISBN-13: 9783658167554
Publisher: Springer Fachmedien Wiesbaden
Publication date: 01/03/2017
Edition description: 1st ed. 2017
Pages: 112
Product dimensions: 5.83(w) x 8.27(h) x 0.01(d)

About the Author

Zhiwen Chen’s research interests include multivariate statistical process monitoring, model-based and data-driven fault diagnosis as well as their application to industrial processes. He is currently working at the School of Information Science and Engineering at Central South University, China.

Table of Contents

A New Index for Performance Evaluation of FD Methods.- CCA-based FD Method for the Monitoring of Stationary Processes.- Projection-based FD Method for the Monitoring of Dynamic Processes.- Benchmark Study and Real-Time Implementation.


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