Design, Analysis and Test of Logic Circuits Under Uncertainty

by Smita Krishnaswamy, Igor L. Markov, John P. Hayes

Overview

Logic circuits are becoming increasingly susceptible to probabilistic behavior caused by external radiation and process variation. In addition, inherently probabilistic quantum- and nano-technologies are on the horizon as we approach the limits of CMOS scaling. Ensuring the reliability of such circuits despite the probabilistic behavior is a key challenge in IC design—-one that necessitates a fundamental, probabilistic reformulation of synthesis and testing techniques. This monograph will present techniques for analyzing, designing, and testing logic circuits with probabilistic behavior.

Product Details

ISBN-13:	9789400797987
Publisher:	Springer Netherlands
Publication date:	10/15/2014
Series:	Lecture Notes in Electrical Engineering , #115
Edition description:	2013
Pages:	124
Product dimensions:	6.10(w) x 9.25(h) x 0.01(d)

Table of Contents

Introduction.- Probabilistic Transfer Matrices.- Computing with Probabilistic Transfer Matrices.- Testing Logic Circuits for Probabilistic Faults.- Signtaure-based Reliability Analysis.- Design for Robustness.- Summary and Extensions.