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Field Emission Scanning Electron Microscopy: New Perspectives for Materials Characterization

By Nicolas Brodusch, Hendrix Demers, Raynald Gauvin
Paperback
$79.99
By Nicolas Brodusch, Hendrix Demers, Raynald Gauvin
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This book highlights what is now achievable in terms of materials characterization with the new generation of cold-field emission scanning electron microscopes applied to real materials at high spatial resolution. It discusses advanced scanning electron microscopes/scanning- transmission electron microscopes (SEM/STEM), simulation and post-processing techniques at high spatial resolution in the fields of nanomaterials, metallurgy, geology, and more. These microscopes now offer improved perf...