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Forces in Scanning Probe Methods

By H.-J. Gïntherodt (Editor), D. Anselmetti (Editor), E. Meyer (Editor)
Hardcover
$329.99
By H.-J. Gïntherodt (Editor), D. Anselmetti (Editor), E. Meyer (Editor)
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The invention of scanning tunneling microscopy, atomic force microscopy and near field optical microscopy has opened up a new field of research: scanning probe methods (SMP). The quality of image acquisition has made great strides in recent times, but many fundamental, unsolved problems remain unanswered about the interaction between probe tip and sample.
Forces in Scanning Probe Methods contains 60 contributions dedicated to these problems. Most of the contributions are reviews, presentin...

Categories

Science & TechnologyEngineeringEngineering TechnologyApplied ScienceOptics - General & MiscellaneousMicroscopes & Microscopy - General & MiscellaneousScanning probe microscopy