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Materials Reliability in Microelectronics III: Volume 309

By Kenneth P. Rodbell (Editor), William F. Filter (Editor), Harold J. Frost (Editor), Paul S. Ho (Editor)
Paperback
$37.00
By Kenneth P. Rodbell (Editor), William F. Filter (Editor), Harold J. Frost (Editor), Paul S. Ho (Editor)
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The MRS Symposium Proceeding series is an internationally recognised reference suitable for researchers and practitioners.

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Science & TechnologyEngineeringElectrical & Electronic EngineeringElectronics - Microelectronics