Materials Reliability in Microelectronics III: Volume 309

Materials Reliability in Microelectronics III: Volume 309

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Overview

Materials Reliability in Microelectronics III: Volume 309 by Kenneth P. Rodbell

The MRS Symposium Proceeding series is an internationally recognised reference suitable for researchers and practitioners.

Product Details

ISBN-13: 9781107409484
Publisher: Cambridge University Press
Publication date: 06/05/2014
Series: MRS Proceedings
Pages: 514
Product dimensions: 5.98(w) x 9.02(h) x 1.02(d)

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