ISBN-10:
0306423871
ISBN-13:
9780306423871
Pub. Date:
07/31/1986
Publisher:
Springer US
Principles of Analytical Electron Microscopy / Edition 1

Principles of Analytical Electron Microscopy / Edition 1

Hardcover

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Product Details

ISBN-13: 9780306423871
Publisher: Springer US
Publication date: 07/31/1986
Edition description: 1986
Pages: 448
Product dimensions: 6.14(w) x 9.21(h) x 0.04(d)

Table of Contents

1 Electron Beam-Specimen Interactions in the Analytical Electron Microscope.- 2 Introductory Electron Optics.- 3 Principles of Image Formation.- 4 Principles of X-Ray Energy-Dispersive Spectrometry in the Analytical Electron Microscope.- 5 Quantitative X-Ray Analysis.- 6 EDS Quantitation and Application to Biology.- 7 The Basic Principles of EELS.- 8 Quantitative Microanalysis Using EELS.- 9 Electron Microdiffraction.- 10 Barriers to AEM: Contamination and Etching.- 11 Radiation Effects Encountered by Inorganic Materials in Analytical Electron Microscopy.- 12 High-Resolution Microanalysis and Energy-Filtered Imaging in Biology.- 13 A Critique of the Continuum Normalization Method used for Biological X-Ray Microanalysis.

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