Scanning Electron Microscopy, X-Ray Microanalysis, and Analytical Electron Microscopy: A Laboratory Workbook
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By Charles E. Lyman, Dale E. Newbury, Joseph Goldstein, David B. Williams, Alton D. Romig Jr., John Armstrong, Patrick Echlin, Charles Fiori, David C. Joy, Eric Lifshin, Klaus-Rüdiger Peters
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During the last four decades remarkable developments have taken place in instrumentation and techniques for characterizing the microstructure and microcomposition of materials. Some of the most important of these instruments involve the use of electron beams because of the wealth of information that can be obtained from the interaction of electron beams with matter. The principal instruments include the scanning electron microscope, electron probe x-ray microanalyzer, and the analytical tra...






















