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Semiconductor Device and Failure Analysis: Using Photon Emission Microscopy

By Wai Kin Chim
Hardcover
$269.95
By Wai Kin Chim
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The diminishing size and greater complexity of modern semiconductor integrated circuits poses new challenges in fault detection. Photon Emission Microscopy (PEM) is a physical fault localisation technique used for analysing IC failures. Detailing the PEM technique and its application to semiconductor device analysis, this unique reference:
* Illustrates the application of the PEM technique in various areas of device reliability, in particular hot-carrier, oxide and ESD reliability.
* Presen...

Categories

Science & TechnologyEngineeringElectrical & Electronic EngineeringElectronics - Semiconductors