This book targets custom IC designers who are encountering variation issues in their designs, especially for modern process nodes at 45nm and below, such as statistical process variations, environmental variations, and layout effects. It teaches them the state-of-the-art in Variation-Aware Design tools, which help the designer to analyze quickly the variation effects, identify the problems, and fix the problems. Furthermore, this book describes the algorithms and algorithm behavior/performance/limitations, which is of use to designers considering these tools, designers using these tools, CAD researchers, and CAD managers.
|Publisher:||Springer New York|
|Product dimensions:||6.10(w) x 9.25(h) x 0.02(d)|
Table of Contents
Introduction.- Fast PTV Verification and Design.- Pictoral Primer on Probablilities.- 3-Sigma Verification and Design.- High-Sigma Verification and Design.- Variation-Aware Design.- Conclusion.