X-Parameters: Characterization, Modeling, and Design of Nonlinear RF and Microwave Components

by David E. Root, Jan Verspecht, Jason Horn, Mihai Marcu

Overview

This is the definitive guide to X-parameters, written by the original inventors and developers of this powerful new paradigm for nonlinear RF and microwave components and systems. Learn how to use X-parameters to overcome intricate problems in nonlinear RF and microwave engineering. The general theory behind X-parameters is carefully and intuitively introduced, and then simplified down to specific, practical cases, providing you with useful approximations that will greatly reduce the complexity of measuring, modeling and designing for nonlinear regimes of operation. Containing real-world case studies, definitions of standard symbols and notation, detailed derivations within the appendices, and exercises with solutions, this is the definitive stand-alone reference for researchers, engineers, scientists and students looking to remain on the cutting-edge of RF and microwave engineering.

Product Details

ISBN-13:	9780521193238
Publisher:	Cambridge University Press
Publication date:	09/26/2013
Series:	The Cambridge RF and Microwave Engineering Series
Edition description:	New Edition
Pages:	233
Product dimensions:	6.80(w) x 9.70(h) x 0.70(d)

About the Author

David E. Root is an Agilent Research Fellow at Agilent Technologies. He co-led the Agilent research and technical development of X-parameters through its commercialization. He is a Fellow of the IEEE and co-editor of Nonlinear Transistor Model Parameter Extraction Techniques (2011).

Jan Verspecht is a Master Research Engineer at Agilent Technologies. He invented X-parameters in 1996 and is a Fellow of the IEEE.

Jason Horn is an Expert Design Engineer at Agilent Technologies and has been heavily involved in the development of X-parameter measurements.

Mihai Marcu is a Senior Consultant at Agilent Technologies, deeply involved in the development and application of X-parameters for non-linear modeling.

Table of Contents

1. S-parameters; 2. X-parameters; 3. Small-signal sensitivities in the X-parameters; 4. X-parameter measurements; 5. Multi-tone multi-port X-parameters; 6. Memory.

Editorial Reviews

"This book is an excellent treatise by experts from Agilent on the assumption and use of x-parameters."
Alfy Riddle, IEEE Microwave Magazine

From the Publisher