This book aims to highlight the research activities in the domain of thermal-aware testing. Thermal-aware testing can be employed both at circuit level and at system level
Describes range of algorithms for addressing thermal-aware test issue, presents comparison of temperature reduction with power-aware techniques and include results on benchmark circuits and systems for different techniques
This book will be suitable for researchers working on power- and thermal-aware design and the testing of digital VLSI chips
Thermal-Aware Testing of Digital VLSI Circuits and Systems
This book aims to highlight the research activities in the domain of thermal-aware testing. Thermal-aware testing can be employed both at circuit level and at system level
Describes range of algorithms for addressing thermal-aware test issue, presents comparison of temperature reduction with power-aware techniques and include results on benchmark circuits and systems for different techniques
This book will be suitable for researchers working on power- and thermal-aware design and the testing of digital VLSI chips
29.99
In Stock
5
1
Thermal-Aware Testing of Digital VLSI Circuits and Systems
138
Thermal-Aware Testing of Digital VLSI Circuits and Systems
138
29.99
In Stock
Product Details
| ISBN-13: | 9781351227766 |
|---|---|
| Publisher: | CRC Press |
| Publication date: | 04/24/2018 |
| Sold by: | Barnes & Noble |
| Format: | eBook |
| Pages: | 138 |
| File size: | 2 MB |
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